GaAs, Growing Method: VGF(100) Si doped, N-type, 4" dia x 0.625mm, 2sp, Carrier Concentration: (1.47-3.78) x 10^18 /cm^3 - GASia100D06C2US5

GaAs, Growing Method: VGF(100) Si doped, N-type, 4" dia x 0.625mm, 2sp, Carrier Concentration: (1.47-3.78) x 10^18 /cm^3 - GASia100D06C2US5

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GaAs, Growing Method: VGF(100) Si doped, N-type, 4" dia x 0.625mm, 2sp, Carrier Concentration: (1.47-3.78) x 10^18 /cm^3 - GASia100D06C2US5

GaAs, Growing Method: VGF(100) Si doped, N-type, 4" dia x 0.625mm, 2sp, Carrier Concentration: (1.47-3.78) x 10^18 /cm^3 - GASia100D06C2US5

SKU: gaas-growing-method-vgf100-si-doped-n-type-4-dia-x-0-625mm-2sp-carrier-concentration-1-47-3-78-x-10-18-cm-3-gasia100d06c2us5

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Description

GaAs single crystal wafer Growing Method: VGF Orientation:                               (100) Size:                                         4"  dia x 0.625 mm Polishing:                                  two sides polished Doping:                                     Si doped Conductor type:                         S-C-N Carrier Concentration:                (1.47-3.78) x 10^18/cm^3 Mobility:                                    (1600 - 2130) cm^2/V.S Resistivity:                                (1.03 - 2.01) E-3  ohm.cm EPD:                                        < 5000cm^2 Ra(Average Roughness) :           < 0.4 nm EPI ready surface and packing Related Products Other GaAs InSb Other InAs InP GaSb Wafer Box Film Coater RTP Furnaces

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