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Reflectance Spectrometer for Film Thickness Measurement from 15nm to 50 um - TFMS-LD 
Reflectance Spectrometer for Film Thickness Measurement from 15nm to 50 um - TFMS-LD
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In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD 
In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD
