Al2O3 - Sapphire Wafer 0.5"x0.5"x0.5 mm, A plane (11-20), 1 SP - ALA121205S1

Al2O3 - Sapphire Wafer 0.5"x0.5"x0.5 mm, A plane (11-20), 1 SP - ALA121205S1

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Al2O3 - Sapphire Wafer 0.5"x0.5"x0.5 mm, A plane (11-20), 1 SP - ALA121205S1

Al2O3 - Sapphire Wafer 0.5"x0.5"x0.5 mm, A plane (11-20), 1 SP - ALA121205S1

SKU: al2o3-sapphire-wafer-0-5x0-5x0-5-mm-a-plane-11-20-1-sp-ala121205s1

Price: RFQ

Description

Feat ures:

  • Sapphire substrate is the popular substrates for III-V nitrides, superconductor and magnetic epi film due to less mis-matched lattice and stable chemical and physical properties . 
  • Wafer size:0.5" x 0.5" x 0.5 mm thick 
  • Orientation tolerance: +/-0.5 Deg. A plane orientation 
  • Polished surface: substrate surface is EPI polished via a special CMP procedure with RA < 8 A 1 side polished 
  • Package: Each wafer is packed in 1000 class clean room with 100 grade plastic bag with wafer container 

Typical Properties: 

  • Crystal Structure: Hexagonal. a=4.758 Angstroms c=12.99 Angstroms 
  • Melting Point: 2040 degree C 
  • Density: 3.97 gram/cm 2 
  • Growth Technique: CZ Crystal Purity:  >99.99%
  • Hardness: 9 (mohs) 
  • Thermal Expansion : 7.5x10 -6 ( / o C) 
  • Thermal Conductivity: 46.06 @ 0 o C, 25.12 @ 100 o C, 12.56 @ 400 o C ( W/(m.K) ) 
  • Dielectric Constant: ~ 9.4 @ 300K  at A axis, ~ 11.58 @ 300K at C axis
  • Loss Tangent at 10 GHz: < 2x10 -5 at A axis , < 5 x10 -5 at C axis 

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