Description
Silicon Nitride Film
- Si3N4 Film coated by low stress LPCVD method
- Si3N4 Thickness:1000 nm +/- 10%
- Si3N4 covers both sides of Silicon wafer
- Refractive Index of Si3N4: 1.95 - 2.05
Silicon Wafer Specifications:
- Conductive type: Si P- type, B-doped
- Resistivity: 1-20 ohm-cm
- Size: 4" diameter +/- 0.5 mm x 0.525 +/- 0.025 mm th
- Orientation: (100) +/- 0.5o
- Polish: One side polished
- Surface roughness: Prime
- Packing: Vacuum packed on a 4" single wafer carrier box
- Optional: you may need the tool below to handle the wafer ( click picture to order )
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